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Information card for entry 4308360
Preview
| Coordinates | 4308360.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C53 H62 Au Cl Ga N2 P |
|---|---|
| Calculated formula | C53 H62 Au Cl Ga N2 P |
| SMILES | [Au]([Ga]1(Cl)[N](c2c(cccc2C(C)C)C(C)C)=C(C=C(N1c1c(C(C)C)cccc1C(C)C)C)C)[P](c1ccccc1)(c1ccccc1)c1ccccc1.c1ccccc1 |
| Title of publication | Insertion of Ga(DDP) into the Au‒Cl Bond of (PPh3)AuCl: A First Structurally Characterized Au‒Ga Bond |
| Authors of publication | Kempter, Andreas; Gemel, Christian; Fischer, Roland A. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2005 |
| Journal volume | 44 |
| Journal issue | 2 |
| Pages of publication | 163 - 165 |
| a | 22.708 ± 0.008 Å |
| b | 13.753 ± 0.005 Å |
| c | 15.9 ± 0.006 Å |
| α | 90° |
| β | 101.593 ± 0.009° |
| γ | 90° |
| Cell volume | 4864 ± 3 Å3 |
| Cell temperature | 203 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0751 |
| Residual factor for significantly intense reflections | 0.0552 |
| Weighted residual factors for significantly intense reflections | 0.1324 |
| Weighted residual factors for all reflections included in the refinement | 0.1435 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.015 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4308360.html
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