Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4311810
Preview
| Coordinates | 4311810.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C48 H40 P2 Se10 Te |
|---|---|
| Calculated formula | C48 H40 P2 Se10 Te |
| SMILES | c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1.[Se]1[Se][Se][Se][Se][Te]21[Se][Se][Se][Se][Se]2.c1(ccccc1)[P+](c1ccccc1)(c1ccccc1)c1ccccc1 |
| Title of publication | Syntheses and Characterization of Some Mixed Te/Se Polychalcogenide Anions [TemSen]2- |
| Authors of publication | Perumal Sekar; James A. Ibers |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2004 |
| Journal volume | 43 |
| Pages of publication | 5436 - 5441 |
| a | 9.8811 ± 0.0012 Å |
| b | 14.0423 ± 0.0016 Å |
| c | 18.57 ± 0.002 Å |
| α | 90° |
| β | 103.052 ± 0.002° |
| γ | 90° |
| Cell volume | 2510.1 ± 0.5 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0997 |
| Residual factor for significantly intense reflections | 0.0736 |
| Weighted residual factors for significantly intense reflections | 0.1989 |
| Weighted residual factors for all reflections included in the refinement | 0.219 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4311810.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.