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Information card for entry 4311902
Preview
| Coordinates | 4311902.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H60 Cl3 N3 Si3 Sn3 |
|---|---|
| Calculated formula | C36 H60 Cl3 N3 Si3 Sn3 |
| SMILES | [Sn]1([Cl][Sn]([Cl][Sn]([Cl]1)N([Si](C)(C)C)c1c(cc(cc1C)C)C)N([Si](C)(C)C)c1c(cc(cc1C)C)C)N([Si](C)(C)C)c1c(cc(cc1C)C)C |
| Title of publication | Syntheses and Structural Characterization of a Monomeric Tin(II) Diamide and a Novel Chlorotin(II) Amide Trimer |
| Authors of publication | Yongjun Tang; Ana M. Felix; Lev N. Zakharov; Arnold L. Rheingold; Richard A. Kemp |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2004 |
| Journal volume | 43 |
| Pages of publication | 7239 - 7242 |
| a | 17.3324 ± 0.0011 Å |
| b | 13.6799 ± 0.0009 Å |
| c | 19.6416 ± 0.0012 Å |
| α | 90° |
| β | 90.522 ± 0.001° |
| γ | 90° |
| Cell volume | 4656.9 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0305 |
| Residual factor for significantly intense reflections | 0.0252 |
| Weighted residual factors for significantly intense reflections | 0.0592 |
| Weighted residual factors for all reflections included in the refinement | 0.0614 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4311902.html
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