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Information card for entry 4312100
Preview
| Coordinates | 4312100.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H32 Co3 F24 O4 |
|---|---|
| Calculated formula | C52 H32 Co3 F24 O4 |
| Title of publication | Homoleptic Cobalt and Copper Phenolate A2[M(OAr)4] Compounds: The Effect of Phenoxide Fluorination |
| Authors of publication | Marisa C. Buzzeo; Amber H. Iqbal; Charli M. Long; David Millar; Sonal Patel; Matthew A. Pellow; Sahar A. Saddoughi; Abigail L. Smenton; John F. C. Turner; Jay D. Wadhawan; Richard G. Compton; James A. Golen; Arnold L. Rheingold; Linda H. Doerrer |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2004 |
| Journal volume | 43 |
| Pages of publication | 7709 - 7725 |
| a | 24.202 ± 0.003 Å |
| b | 13.9911 ± 0.0017 Å |
| c | 17.1697 ± 0.0019 Å |
| α | 90° |
| β | 114.678 ± 0.002° |
| γ | 90° |
| Cell volume | 5282.9 ± 1.1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1371 |
| Residual factor for significantly intense reflections | 0.0967 |
| Weighted residual factors for significantly intense reflections | 0.2937 |
| Weighted residual factors for all reflections included in the refinement | 0.3172 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.099 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4312100.html
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