Information card for entry 4312372

Structure parameters

• Chemical name: tetrakis(mu2-trifluoroacetato-O,O')-bis(diphenyl sulfone-O)-di-rhodium(II,II)), dichloromethane solvate
• Formula: C34 H24 Cl4 F12 O12 Rh2 S2
• Calculated formula: C34 H24 Cl4 F12 O12 Rh2 S2
• SMILES: C1(C(F)(F)F)=[O][Rh]234([O]=C(C(F)(F)F)O[Rh]4(O1)([O]=C(O3)C(F)(F)F)([O]=C(C(F)(F)F)O2)[O]=S(c1ccccc1)(=O)c1ccccc1)[O]=S(c1ccccc1)(=O)c1ccccc1.C(Cl)Cl.C(Cl)Cl
• Title of publication: The First Coordination Complexes of Selenones: A Structural Comparison with Complexes of Sulfones
• Authors of publication: Evgeny V. Dikarev; Renee Y. Becker; Eric Block; Zhixing Shan; R. Curtis Haltiwanger; Marina A. Petrukhina
• Journal of publication: Inorganic Chemistry
• Year of publication: 2003
• Journal volume: 42
• Pages of publication: 7098 - 7105
• a: 8.3668 ± 0.0007 Å
• b: 9.4711 ± 0.0008 Å
• c: 14.2118 ± 0.0012 Å
• α: 86.226 ± 0.001°
• β: 73.887 ± 0.001°
• γ: 88.154 ± 0.001°
• Cell volume: 1079.48 ± 0.16 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.04
• Residual factor for significantly intense reflections: 0.0344
• Weighted residual factors for significantly intense reflections: 0.0826
• Weighted residual factors for all reflections included in the refinement: 0.0854
• Goodness-of-fit parameter for all reflections included in the refinement: 1.048
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No