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Information card for entry 4312911
Preview
| Coordinates | 4312911.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C99 H56.5 Cl3.5 N16 Nb |
|---|---|
| Calculated formula | C99 Cl3.5 N16 Nb |
| Title of publication | "Stapled" Bis(phthalocyaninato)niobium(IV), Pc2Nb: X-ray Crystal Structure, Chemical and Electrochemical Behavior, and Theoretical Studies. Perspectives for the Use of Pc2Nb (Thin Films) as an "Optically Passive Electrode" in Electrochromic Devices |
| Authors of publication | Elvira M. Bauer; Maria Pia Donzello; Claudio Ercolani; Enrico Masetti; Stefania Panero; Giampaolo Ricciardi; Angela Rosa; Angiola Chiesi-Villa; Corrado Rizzoli |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 283 - 293 |
| a | 16.765 ± 0.003 Å |
| b | 23.8 ± 0.004 Å |
| c | 19.421 ± 0.004 Å |
| α | 90 ± 0° |
| β | 92.51 ± 0.02° |
| γ | 90 ± 0° |
| Cell volume | 7742 ± 2 Å3 |
| Cell temperature | 295 K |
| Ambient diffraction temperature | 295 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.1475 |
| Residual factor for significantly intense reflections | 0.0524 |
| Weighted residual factors for all reflections | 0.1411 |
| Weighted residual factors for significantly intense reflections | 0.1222 |
| Goodness-of-fit parameter for all reflections | 0.884 |
| Goodness-of-fit parameter for significantly intense reflections | 1.07 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4312911.html
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