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Information card for entry 4313115
Preview
| Coordinates | 4313115.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H33 B10 P |
|---|---|
| Calculated formula | C25 H33 B10 P |
| SMILES | [P+](c1ccccc1)(c1ccccc1)(c1ccccc1)Cc1ccccc1.[BH]1234[BH]5678[BH]9%101[BH]1%112[BH]235([BH]356[BH]679[BH]7%101[BH]%1123[BH]567)[H]48 |
| Title of publication | The Solid State Structure of [B10H11]- and Its Dynamic NMR Spectra in Solution |
| Authors of publication | Sheldon G. Shore; Ewan J. M. Hamilton; Adam N. Bridges; Joseph Bausch; Jeanette A. Krause-Bauer; Danan Dou; Jianping Liu; Shengming Liu; Bin Du; Heather Hall; Edward A. Meyers; Karl E. Vermillion |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 1175 - 1186 |
| a | 10.067 ± 0.005 Å |
| b | 19.009 ± 0.009 Å |
| c | 15.247 ± 0.007 Å |
| α | 90° |
| β | 107.952 ± 0.009° |
| γ | 90° |
| Cell volume | 2776 ± 2 Å3 |
| Cell temperature | 297 ± 2 K |
| Ambient diffraction temperature | 297 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1022 |
| Residual factor for significantly intense reflections | 0.0565 |
| Weighted residual factors for all reflections | 0.1564 |
| Weighted residual factors for significantly intense reflections | 0.1336 |
| Goodness-of-fit parameter for all reflections | 1.115 |
| Goodness-of-fit parameter for significantly intense reflections | 1.233 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4313115.html
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Users of the data should acknowledge the original authors of the
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