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Information card for entry 4313833
Preview
| Coordinates | 4313833.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H45 Cl N6 Si3 U |
|---|---|
| Calculated formula | C34 H45 Cl N6 O Si3 U |
| SMILES | [U]12345(Cl)N(c6ccccc6)[Si]([N]16CC[N]2([Si](N5c1ccccc1)(C)C)CC[N]3([Si](N4c1ccccc1)(C)C)CC6)(C)C.C1CCCOCC1 |
| Title of publication | Triamidotriazacyclononane Complexes of Group 3 Metals. Synthesis and Crystal Structures |
| Authors of publication | Bernardo Monteiro; Dmitrii Roitershtein; Humberto Ferreira; José R. Ascenso; Ana M. Martins; Ângela Domingos; Noémia Marques |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 4223 - 4231 |
| a | 13.267 ± 0.002 Å |
| b | 16.472 ± 0.002 Å |
| c | 17.285 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3777.4 ± 1.1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.117 |
| Residual factor for significantly intense reflections | 0.0671 |
| Weighted residual factors for significantly intense reflections | 0.1184 |
| Weighted residual factors for all reflections included in the refinement | 0.1374 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4313833.html
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