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Information card for entry 4313897
Preview
| Coordinates | 4313897.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C34 H42 F6 N2 O7 Pt S2 Te |
|---|---|
| Calculated formula | C34 H42 F6 N2 O7 Pt S2 Te |
| SMILES | [Pt]1([Te](c2ccccc2)c2ccccc2)([n]2ccc(cc2c2cc(cc[n]12)C(C)(C)C)C(C)(C)C)(C)(C)[OH2].O=S(=O)([O-])C(F)(F)F.O=S(=O)([O-])C(F)(F)F |
| Title of publication | Oxidative Addition of Ph2TeCl2 to a Dimethylplatinum(II) Complex: Effects of Secondary Bonding in the Platinum-Tellurium Products |
| Authors of publication | Michael C. Janzen; Michael C. Jennings; Richard J. Puddephatt |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 4553 - 4558 |
| a | 19.8505 ± 0.0003 Å |
| b | 14.4878 ± 0.0002 Å |
| c | 27.9326 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 8033.14 ± 0.19 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.0678 |
| Residual factor for significantly intense reflections | 0.035 |
| Weighted residual factors for significantly intense reflections | 0.0803 |
| Weighted residual factors for all reflections included in the refinement | 0.0864 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.965 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4313897.html
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