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Information card for entry 4314105
Preview
| Coordinates | 4314105.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As2 H65 Na12 Ni3 O100.5 W18 |
|---|---|
| Calculated formula | As2 Na10 Ni3 O99.5 W18 |
| Title of publication | Structure, Magnetism, and Electrochemistry of the Multinickel Polyoxoanions [Ni~6~As~3~W~24~O~94~(H~2~O)~2~]^17-^, [Ni~3~Na(H~2~O)~2~(AsW~9~O~34~)~2~]^11-^, and [Ni~4~Mn~2~P~3~W~24~O~94~(H~2~O)~2~]^17-^ |
| Authors of publication | Israel M. Mbomekalle; Bineta Keita; Martine Nierlich; Ulrich Kortz; Patrick Berthet; Louis Nadjo |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 5143 - 5152 |
| a | 12.228 ± 0.002 Å |
| b | 16.743 ± 0.003 Å |
| c | 23.342 ± 0.005 Å |
| α | 78.5 ± 0.03° |
| β | 80.69 ± 0.03° |
| γ | 78.66 ± 0.03° |
| Cell volume | 4554 ± 1.6 Å3 |
| Cell temperature | 123 ± 2 K |
| Ambient diffraction temperature | 123 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1319 |
| Residual factor for significantly intense reflections | 0.0695 |
| Weighted residual factors for significantly intense reflections | 0.147 |
| Weighted residual factors for all reflections included in the refinement | 0.174 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.968 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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