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Information card for entry 4314750
Preview
| Coordinates | 4314750.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H53 B Cu N6 P S3 |
|---|---|
| Calculated formula | C36 H53 B Cu N6 P S3 |
| SMILES | Cn1c2=[S][Cu]3([P](C4CCCCC4)(C4CCCCC4)C4CCCCC4)[S]=c4n(ccn4C)[B](n4ccn(c4=[S]3)C)(n2cc1)c1ccccc1 |
| Title of publication | Surface Science of Soft Scorpionates |
| Authors of publication | Dawn Wallace; Edward J. Quinn; David R. Armstrong; John Reglinski; Mark D. Spicer; W. Ewen Smith |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 1420 - 1427 |
| a | 9.8533 ± 0.0002 Å |
| b | 10.0078 ± 0.0002 Å |
| c | 19.8773 ± 0.0004 Å |
| α | 90.41 ± 0.001° |
| β | 94.723 ± 0.001° |
| γ | 106.028 ± 0.001° |
| Cell volume | 1876.59 ± 0.07 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0588 |
| Residual factor for significantly intense reflections | 0.0411 |
| Weighted residual factors for significantly intense reflections | 0.0828 |
| Weighted residual factors for all reflections included in the refinement | 0.0915 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.031 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4314750.html
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