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Information card for entry 4315226
Preview
| Coordinates | 4315226.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | F5 Xe Os2 O6 F5 |
|---|---|
| Formula | F10 O6 Os2 Xe |
| Calculated formula | F10 O6 Os2 Xe |
| SMILES | [F]([Os](=O)(=O)(F)(F)=O)[Os](F)(F)(=O)(=O)=O.F[Xe](F)(F)(F)F |
| Title of publication | Syntheses, Raman Spectra, and X-ray Crystal Structures of [XeF5][μ-F(OsO3F2)2] and [M][OsO3F3] (M = XeF5+, Xe2F11+) |
| Authors of publication | Michael J. Hughes; Hélène P. A. Mercier; Gary J. Schrobilgen |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 3501 - 3515 |
| a | 12.6724 ± 0.0011 Å |
| b | 11.4443 ± 0.001 Å |
| c | 7.5818 ± 0.0007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1099.56 ± 0.17 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0351 |
| Residual factor for significantly intense reflections | 0.0273 |
| Weighted residual factors for significantly intense reflections | 0.0477 |
| Weighted residual factors for all reflections included in the refinement | 0.0486 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.417 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4315226.html
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