Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4315228
Preview
| Coordinates | 4315228.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | Xe2 F11 Os O3 F3 |
|---|---|
| Formula | F14 O3 Os Xe2 |
| Calculated formula | F14 O3 Os Xe2 |
| SMILES | F[Os](F)(=O)(F)(=O)=O.[F]([Xe](F)(F)(F)(F)F)[Xe](F)(F)(F)(F)F |
| Title of publication | Syntheses, Raman Spectra, and X-ray Crystal Structures of [XeF5][μ-F(OsO3F2)2] and [M][OsO3F3] (M = XeF5+, Xe2F11+) |
| Authors of publication | Michael J. Hughes; Hélène P. A. Mercier; Gary J. Schrobilgen |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 3501 - 3515 |
| a | 9.247 ± 0.0003 Å |
| b | 15.1769 ± 0.0005 Å |
| c | 8.1192 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1139.45 ± 0.06 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 62 |
| Hermann-Mauguin space group symbol | P n m a |
| Hall space group symbol | -P 2ac 2n |
| Residual factor for all reflections | 0.0274 |
| Residual factor for significantly intense reflections | 0.0249 |
| Weighted residual factors for significantly intense reflections | 0.0597 |
| Weighted residual factors for all reflections included in the refinement | 0.0604 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.486 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4315228.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.