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Information card for entry 4315649
Preview
| Coordinates | 4315649.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H30 S6 V |
|---|---|
| Calculated formula | C42 H30 S6 V |
| SMILES | C1(S[V]23(SC=1c1ccccc1)(SC(c1ccccc1)=C(S3)c1ccccc1)SC(=C(S2)c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication | Six-Membered Electron Transfer Series [V(dithiolene)3]z (z= 1+, 0, 1-, 2-, 3-, 4-). An X-ray Absorption Spectroscopic and Density Functional Theoretical Study |
| Authors of publication | Stephen Sproules; Thomas Weyhermüller; Serena DeBeer; Karl Wieghardt |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 5241 - 5261 |
| a | 19.1064 ± 0.0006 Å |
| b | 11.253 ± 0.0004 Å |
| c | 17.9293 ± 0.0006 Å |
| α | 90° |
| β | 107.282 ± 0.003° |
| γ | 90° |
| Cell volume | 3680.8 ± 0.2 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0662 |
| Residual factor for significantly intense reflections | 0.0423 |
| Weighted residual factors for significantly intense reflections | 0.0911 |
| Weighted residual factors for all reflections included in the refinement | 0.1009 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4315649.html
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