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Information card for entry 4316263
Preview
| Coordinates | 4316263.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H72 Cl N2 O4 V |
|---|---|
| Calculated formula | C42 H72 Cl N2 O4 V |
| SMILES | C1C[N](C)(C)[V]23([N]1(Cc1c(c(cc(c1)C(C)(C)C)C(C)(C)C)O2)Cc1c(c(cc(c1)C(C)(C)C)C(C)(C)C)O3)([O]1CCCC1)Cl.CCOCC |
| Title of publication | Vanadium Diaminebis(phenolate) Complexes: Syntheses, Structures, and Reactivity in Sulfoxidation Catalysis |
| Authors of publication | Sónia Barroso; Pedro Adão; Filipe Madeira; M. Teresa Duarte; João Costa Pessoa; Ana M. Martins |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 7452 - 7463 |
| a | 27.851 ± 0.007 Å |
| b | 9.717 ± 0.003 Å |
| c | 17.162 ± 0.005 Å |
| α | 90° |
| β | 94.182 ± 0.015° |
| γ | 90° |
| Cell volume | 4632 ± 2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 13 |
| Hermann-Mauguin space group symbol | P 1 2/c 1 |
| Hall space group symbol | -P 2yc |
| Residual factor for all reflections | 0.1693 |
| Residual factor for significantly intense reflections | 0.0934 |
| Weighted residual factors for significantly intense reflections | 0.2368 |
| Weighted residual factors for all reflections included in the refinement | 0.2668 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4316263.html
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Users of the data should acknowledge the original authors of the
structural data.