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Information card for entry 4316455
Preview
| Coordinates | 4316455.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H60 N3 Na O Si6 U |
|---|---|
| Calculated formula | C22 H60 N3 Na O Si6 U |
| SMILES | C[Si](C)(C)N1[U]2(C[Si](C)(C)[N]2[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)C[Si]1(C)C.[Na+].O1CCCC1 |
| Title of publication | The Bis Metallacyclic Anion [U(N{SiMe3}2)(CH2SiMe2N{SiMe3})2]- |
| Authors of publication | Olivier Bénaud; Jean-Claude Berthet; Pierre Thuéry; Michel Ephritikhine |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 8117 - 8130 |
| a | 8.5677 ± 0.0006 Å |
| b | 40.256 ± 0.005 Å |
| c | 22.157 ± 0.003 Å |
| α | 90° |
| β | 92.334 ± 0.007° |
| γ | 90° |
| Cell volume | 7635.6 ± 1.5 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.1554 |
| Residual factor for significantly intense reflections | 0.0521 |
| Weighted residual factors for significantly intense reflections | 0.064 |
| Weighted residual factors for all reflections included in the refinement | 0.0764 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.894 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4316455.html
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