Information card for entry 4316546

Structure parameters

• Formula: F14 Sb2 Xe
• Calculated formula: F14 Sb2 Xe
• SMILES: [Xe](F)(F)([F][Sb](F)([F][Sb](F)(F)(F)(F)F)(F)(F)F)F
• Title of publication: X-ray Crystal Structures of [XeF][MF6] (M = As, Sb, Bi), [XeF][M2F11] (M = Sb, Bi) and Estimated Thermochemical Data and Predicted Stabilities for Noble-Gas Fluorocation Salts using Volume-Based Thermodynamics
• Authors of publication: Hugh St. A. Elliott; John F. Lehmann; Hélène P.A. Mercier; H. Donald Brooke Jenkins; Gary J. Schrobilgen
• Journal of publication: Inorganic Chemistry
• Year of publication: 2010
• Journal volume: 49
• Pages of publication: 8504 - 8523
• a: 7.929 ± 0.003 Å
• b: 8.146 ± 0.003 Å
• c: 9.493 ± 0.003 Å
• α: 67.676 ± 0.009°
• β: 88.383 ± 0.015°
• γ: 66.541 ± 0.008°
• Cell volume: 514.8 ± 0.3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 3
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0283
• Residual factor for significantly intense reflections: 0.0272
• Weighted residual factors for significantly intense reflections: 0.0688
• Weighted residual factors for all reflections included in the refinement: 0.0694
• Goodness-of-fit parameter for all reflections included in the refinement: 1.098
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No