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Information card for entry 4316678
Preview
| Coordinates | 4316678.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | As2 Cs6 P6 Se18 |
|---|---|
| Calculated formula | As2 Cs6 P6 Se18 |
| SMILES | P1(=[Se])([Se-])[Se][As]2([Se]P1(=[Se])[Se]2)[Se]P(=[Se])(P([Se][As]12[Se]P(P(=[Se])([Se]1)[Se]2)(=[Se])[Se-])(=[Se])[Se-])[Se-].[Cs+].[Cs+].[Cs+].[Cs+].[Cs+].[Cs+] |
| Title of publication | Arsenic-Containing Chalcophosphate Molecular Anions |
| Authors of publication | Collin D. Morris; Mercouri G. Kanatzidis |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2010 |
| Journal volume | 49 |
| Pages of publication | 9049 - 9054 |
| a | 19.5759 ± 0.0016 Å |
| b | 7.9206 ± 0.0006 Å |
| c | 13.0553 ± 0.0009 Å |
| α | 90° |
| β | 101.914 ± 0.006° |
| γ | 90° |
| Cell volume | 1980.7 ± 0.3 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0724 |
| Residual factor for significantly intense reflections | 0.0546 |
| Weighted residual factors for significantly intense reflections | 0.1354 |
| Weighted residual factors for all reflections included in the refinement | 0.144 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4316678.html
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