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Information card for entry 4317627
Preview
| Coordinates | 4317627.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C82.5 H84 Cl5 F12 O3.5 P6 Pt3 Se2 |
|---|---|
| Calculated formula | C82.5 H72 Cl5 F12 O3.5 P6 Pt3 Se2 |
| Title of publication | Metal Scrambling in the Trinuclear {Pt2Se2M} (M = Pt, Pd, Au) System Using an Electrospray Mass Spectrometry (ESMS) Directed Synthetic Methodology; Isolation and Crystallographic Characterization of {Pt2(μ3-Se)2(PPh3)4[Pt(cod)]}{PF6}2 and {Pt(μ3-Se)2(PPh3)2[Pt(cod)]2}{PF6}2 (cod = Cyclo-octa-1,5-diene) |
| Authors of publication | Jeremy S. L. Yeo; Jagadese J. Vittal; William Henderson; T. S. Andy Hor |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 1194 - 1198 |
| a | 17.693 ± 0.003 Å |
| b | 23.952 ± 0.004 Å |
| c | 21.129 ± 0.004 Å |
| α | 90° |
| β | 91.272 ± 0.005° |
| γ | 90° |
| Cell volume | 8952 ± 3 Å3 |
| Cell temperature | 223 ± 2 K |
| Ambient diffraction temperature | 223 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0765 |
| Residual factor for significantly intense reflections | 0.0482 |
| Weighted residual factors for significantly intense reflections | 0.1163 |
| Weighted residual factors for all reflections included in the refinement | 0.1247 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.981 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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