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Information card for entry 4318308
Preview
| Coordinates | 4318308.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H33 N O3 P3 Si V |
|---|---|
| Calculated formula | C15 H33 N O3 P3 Si V |
| SMILES | [V]12([P](C)(C)C[Si](C[P]1(C)C)(C[P]2(C)C)C(C)(C)C)(N=O)(C#[O])C#[O] |
| Title of publication | Synthesis, Characterization, and Solution Redox Properties of (trimpsi)M(CO)2(NO) Complexes [M = V, Nb, Ta; trimpsi = tBuSi(CH2PMe2)3] |
| Authors of publication | Trevor W. Hayton; P. James Daff; Peter Legzdins; Steven J. Rettig; Brian O. Patrick |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 4114 - 4126 |
| a | 16.453 ± 0.002 Å |
| b | 10.246 ± 0.001 Å |
| c | 13.488 ± 0.001 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2273.8 ± 0.4 Å3 |
| Cell temperature | 173.2 K |
| Ambient diffraction temperature | 173.2 K |
| Number of distinct elements | 7 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.0936 |
| Residual factor for significantly intense reflections | 0.045 |
| Weighted residual factors for all reflections | 0.1445 |
| Weighted residual factors for all reflections included in the refinement | 0.1445 |
| Goodness-of-fit parameter for all reflections | 0.955 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.955 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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