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Information card for entry 4319010
Preview
| Coordinates | 4319010.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H30 Al N2 P Se |
|---|---|
| Calculated formula | C16 H30 Al N2 P Se |
| SMILES | P1(=[Se][Al](N1C(C)(C)C)(C)C)(NC(C)(C)C)c1ccccc1 |
| Title of publication | Synthesis and X-ray Structures of Dilithium Complexes of the Phosphonate Anions [PhP(E)(NtBu)2]2- (E = O, S, Se, Te) and Dimethylaluminum Derivatives of [PhP(E)(NtBu)(NHtBu)]- (E = S, Se) |
| Authors of publication | Glen G. Briand; Tristram Chivers; Mark Krahn; Masood Parvez |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 6808 - 6815 |
| a | 15.9353 ± 0.0004 Å |
| b | 14.6635 ± 0.0004 Å |
| c | 8.8872 ± 0.0002 Å |
| α | 90° |
| β | 101.721 ± 0.0012° |
| γ | 90° |
| Cell volume | 2033.35 ± 0.09 Å3 |
| Cell temperature | 170 ± 2 K |
| Ambient diffraction temperature | 170 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.032 |
| Residual factor for significantly intense reflections | 0.0299 |
| Weighted residual factors for significantly intense reflections | 0.0775 |
| Weighted residual factors for all reflections included in the refinement | 0.0797 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.058 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4319010.html
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