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Information card for entry 4319425
Preview
| Coordinates | 4319425.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C53 H41 Al N2 O12 S32 |
|---|---|
| Calculated formula | C53 H36 Al N2 O12 S32 |
| Title of publication | Crystal Chemistry and Physical Properties of Superconducting and Semiconducting Charge Transfer Salts of the Type (BEDT-TTF)4[AIMIII(C2O4)3].PhCN (AI= H3O, NH4, K; MIII= Cr, Fe, Co, Al; BEDT-TTF = Bis(ethylenedithio)tetrathiafulvalene) |
| Authors of publication | Lee Martin; Scott S. Turner; Peter Day; Philippe Guionneau; Judith A. K. Howard; Dai E. Hibbs; Mark E. Light; Michael B. Hursthouse; Mikio Uruichi; Kyuyo Yakushi |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 1363 - 1371 |
| a | 10.318 ± 0.007 Å |
| b | 19.46 ± 0.004 Å |
| c | 35.808 ± 0.008 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 7190 ± 5 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 423 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.1421 |
| Residual factor for significantly intense reflections | 0.0437 |
| Weighted residual factors for all reflections | 0.1058 |
| Weighted residual factors for significantly intense reflections | 0.0887 |
| Goodness-of-fit parameter for all reflections | 0.673 |
| Goodness-of-fit parameter for significantly intense reflections | 0.946 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4319425.html
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