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Information card for entry 4319518
Preview
| Coordinates | 4319518.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H74 Cl Li N3 O3 Si6 Sm |
|---|---|
| Calculated formula | C30 H56 Cl Li N3 O3 Si6 Sm |
| Title of publication | Synthesis and Single-Crystal X-ray Diffraction Examination of a Structurally Homologous Series of Tetracoordinate Heteroleptic Anionic Lanthanide Complexes: Ln{N[Si(CH3)2CH2CH2Si(CH3)2]}3(μ-Cl)Li(L)3 [Ln = Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb; (L)3= (THF)3, (Et2O)3, (THF)2(Et2O)] |
| Authors of publication | Oliver Just; William S. Rees |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 1751 - 1755 |
| a | 11.3962 ± 0.0001 Å |
| b | 21.7309 ± 0.0003 Å |
| c | 19.6745 ± 0.0002 Å |
| α | 90° |
| β | 102.67° |
| γ | 90° |
| Cell volume | 4753.74 ± 0.09 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0526 |
| Residual factor for significantly intense reflections | 0.0352 |
| Weighted residual factors for significantly intense reflections | 0.0812 |
| Weighted residual factors for all reflections included in the refinement | 0.0895 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4319518.html
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