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Information card for entry 4319646
Preview
| Coordinates | 4319646.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | compound 2 |
|---|---|
| Formula | C21 H29 Cl N2 Si Zr |
| Calculated formula | C21 H29 Cl N2 Si Zr |
| SMILES | [Zr]123456789(Cl)(N/[N]1=C\[Si](C)(C)C)([cH]1[cH]9[cH]4[cH]3[cH]21)[cH]1[cH]8[cH]7[cH]6[cH]51.c1(ccccc1)C |
| Title of publication | Synthesis of the Titanium Compound [(MeC5H4)TiCl(μ-NSiMe3)]2 with Migration of a SiMe3 Group and Preparation of Cp2ZrCl(η2-NHNCHSiMe3} |
| Authors of publication | Guangcai Bai; Herbert W. Roesky; Haijun Hao; Mathias Noltemeyer; Hans-Georg Schmidt |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 2424 - 2426 |
| a | 13.053 ± 0.0013 Å |
| b | 17.627 ± 0.003 Å |
| c | 10.477 ± 0.002 Å |
| α | 90° |
| β | 109.425 ± 0.012° |
| γ | 90° |
| Cell volume | 2273.4 ± 0.6 Å3 |
| Cell temperature | 203 ± 2 K |
| Ambient diffraction temperature | 203 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0334 |
| Residual factor for significantly intense reflections | 0.0305 |
| Weighted residual factors for all reflections | 0.082 |
| Weighted residual factors for significantly intense reflections | 0.0772 |
| Goodness-of-fit parameter for all reflections | 1.052 |
| Goodness-of-fit parameter for significantly intense reflections | 1.046 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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