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Information card for entry 4319841
Preview
| Coordinates | 4319841.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | F7 Kr Sb |
|---|---|
| Calculated formula | F7 Kr Sb |
| SMILES | [Sb]([F][Kr]F)(F)(F)(F)(F)F |
| Title of publication | X-ray Crystal Structures of α-KrF2, [KrF][MF6] (M = As, Sb, Bi), [Kr2F3][SbF6].KrF2, [Kr2F3]2[SbF6]2.KrF2, and [Kr2F3][AsF6].[KrF][AsF6]; Synthesis and Characterization of [Kr2F3][PF6].nKrF2; and Theoretical Studies of KrF2, KrF+, Kr2F3+, and the [KrF][MF6] (M = P, As, Sb, Bi) Ion Pairs |
| Authors of publication | John F. Lehmann; David A. Dixon; Gary J. Schrobilgen |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 3002 - 3017 |
| a | 5.2922 ± 0.0006 Å |
| b | 10.4444 ± 0.0013 Å |
| c | 10.7959 ± 0.0013 Å |
| α | 90° |
| β | 94.693 ± 0.004° |
| γ | 90° |
| Cell volume | 594.73 ± 0.12 Å3 |
| Cell temperature | 160 ± 2 K |
| Ambient diffraction temperature | 160 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0455 |
| Residual factor for significantly intense reflections | 0.0266 |
| Weighted residual factors for significantly intense reflections | 0.0496 |
| Weighted residual factors for all reflections included in the refinement | 0.0527 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.92 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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