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Information card for entry 4320198
Preview
| Coordinates | 4320198.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C42 H74 Co N2 S2 |
|---|---|
| Calculated formula | C42 H74 Co N2 S2 |
| SMILES | [Co]1(Sc2c(cc(cc2C(C)(C)C)C(C)(C)C)C(C)(C)C)(Sc2c(cc(cc2C(C)(C)C)C(C)(C)C)C(C)(C)C)[N](CC[N]1(C)C)(C)C |
| Title of publication | Low-Valent Chemistry of Cobalt Amide. Synthesis and Structural Characterization of Cobalt(II) Amido, Aryloxide, and Thiolate Compounds |
| Authors of publication | Hung Kay Lee; Chung Hei Lam; Song-Lin Li; Ze-Ying Zhang; Thomas C. W. Mak |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2001 |
| Journal volume | 40 |
| Pages of publication | 4691 - 4695 |
| a | 23.177 ± 0.005 Å |
| b | 11.056 ± 0.002 Å |
| c | 17.263 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 4423.6 ± 1.6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 33 |
| Hermann-Mauguin space group symbol | P n a 21 |
| Hall space group symbol | P 2c -2n |
| Residual factor for all reflections | 0.1077 |
| Residual factor for significantly intense reflections | 0.0876 |
| Weighted residual factors for significantly intense reflections | 0.2217 |
| Weighted residual factors for all reflections included in the refinement | 0.2372 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.156 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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