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Information card for entry 4321439
Preview
| Coordinates | 4321439.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [OsCl(O2)(dcpe)2]BPh4 |
|---|---|
| Formula | C77 H118 B Cl3 O2 Os P4 |
| Calculated formula | C77 H107 B Cl3 O2 Os P4 |
| Title of publication | Oxo Complexes of Osmium(IV) Formed via Dioxygen Activation. X-ray Structures of [OsX(dcpe)2]PF6 (X = Cl, Br), [OsCl(η2-O2)(dcpe)2]BPh4, and [OsCl(O)(dcpe)2]BPh4 (dcpe = 1,2-Bis(dicyclohexylphosphino)ethane) |
| Authors of publication | Peter Barthazy; Michael Wörle; Heinz Rüegger; Antonio Mezzetti |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2000 |
| Journal volume | 39 |
| Pages of publication | 4903 - 4912 |
| a | 23.585 ± 0.004 Å |
| b | 12.764 ± 0.002 Å |
| c | 25.587 ± 0.004 Å |
| α | 90° |
| β | 103.988 ± 0.001° |
| γ | 90° |
| Cell volume | 7474 ± 2 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0869 |
| Residual factor for significantly intense reflections | 0.046 |
| Weighted residual factors for all reflections | 0.1181 |
| Weighted residual factors for significantly intense reflections | 0.0999 |
| Goodness-of-fit parameter for all reflections | 0.973 |
| Goodness-of-fit parameter for significantly intense reflections | 1.044 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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