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Information card for entry 4321851
Preview
| Coordinates | 4321851.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | tetrakis(trifluoromethyl)diphosphane |
|---|---|
| Chemical name | tetrakis(trifluoromethyl)diphosphane |
| Formula | C4 F11 P2 |
| Calculated formula | C4 F12 P2 |
| SMILES | P(C(F)(F)F)(C(F)(F)F)P(C(F)(F)F)C(F)(F)F |
| Title of publication | Element-Element Bonds. IX.1 Structures of Tetrakis(trifluoromethyl)diphosphane and -diarsane: Experimental and Theoretical Investigations |
| Authors of publication | Gerd Becker; Winfried Golla; Joseph Grobe; Karl Wilhelm Klinkhammer; Duc Le Van; Andreas H. Maulitz; Otto Mundt; Heinz Oberhammer; Martin Sachs |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 1099 - 1107 |
| a | 5.297 ± 0.003 Å |
| b | 6.816 ± 0.002 Å |
| c | 8.028 ± 0.003 Å |
| α | 108.58 ± 0.01° |
| β | 99.66 ± 0.01° |
| γ | 103.29 ± 0.01° |
| Cell volume | 258.09 ± 0.19 Å3 |
| Cell temperature | 173 ± 3 K |
| Ambient diffraction temperature | 173 ± 3 K |
| Number of distinct elements | 3 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0755 |
| Residual factor for significantly intense reflections | 0.0721 |
| Weighted residual factors for all reflections | 0.204 |
| Weighted residual factors for significantly intense reflections | 0.1912 |
| Goodness-of-fit parameter for all reflections | 1.081 |
| Goodness-of-fit parameter for significantly intense reflections | 1.088 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4321851.html
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Users of the data should acknowledge the original authors of the
structural data.