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Information card for entry 4322475
Preview
| Coordinates | 4322475.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H42 Cl2 Cu2 N2 O10 S8 |
|---|---|
| Calculated formula | C24 H42 Cl2 Cu2 N2 O10 S8 |
| Title of publication | A Structural Strategy for Generating Rapid Electron-Transfer Kinetics in Copper(II/I) Systems |
| Authors of publication | Ksenia Krylova; Chandrika P. Kulatilleke; Mary Jane Heeg; Cynthia A. Salhi; L. A. Ochrymowycz; D. B. Rorabacher |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1999 |
| Journal volume | 38 |
| Pages of publication | 4322 - 4328 |
| a | 12.5917 ± 0.0002 Å |
| b | 13.002 ± 0.0003 Å |
| c | 14.9285 ± 0.0003 Å |
| α | 68.356 ± 0.001° |
| β | 84.298 ± 0.001° |
| γ | 61.129 ± 0.001° |
| Cell volume | 1980.05 ± 0.07 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.083 |
| Residual factor for significantly intense reflections | 0.0654 |
| Weighted residual factors for all reflections | 0.1985 |
| Weighted residual factors for significantly intense reflections | 0.1832 |
| Goodness-of-fit parameter for all reflections | 1.062 |
| Goodness-of-fit parameter for significantly intense reflections | 1.149 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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