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Information card for entry 4322590
Preview
| Coordinates | 4322590.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H72 K N4 O3 Zn |
|---|---|
| Calculated formula | C36 H72 K N4 O4 Zn |
| Title of publication | A Homologous Series of Homoleptic Zinc Bis(1,4-di-tert-butyl-1,4-diaza-1,3-butadiene) Complexes: Kx[Zn(t-BuNCHCHN-t-Bu)2], Zn(t-BuNCHCHN-t-Bu)2, and [Zn(t-BuNCHCHN-t-Bu)2](OTf)x (x = 1, 2) |
| Authors of publication | Evelien Rijnberg; Bodo Richter; Karl-H. Thiele; Jaap Boersma; Nora Veldman; Anthony L. Spek; Gerard van Koten |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1998 |
| Journal volume | 37 |
| Pages of publication | 56 - 63 |
| a | 10.8702 ± 0.001 Å |
| b | 11.5175 ± 0.0009 Å |
| c | 18.2815 ± 0.0013 Å |
| α | 73.795 ± 0.006° |
| β | 74.227 ± 0.006° |
| γ | 75.736 ± 0.007° |
| Cell volume | 2078.8 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0929 |
| Residual factor for significantly intense reflections | 0.0586 |
| Weighted residual factors for all reflections | 0.1395 |
| Weighted residual factors for significantly intense reflections | 0.1216 |
| Goodness-of-fit parameter for all reflections | 1.022 |
| Goodness-of-fit parameter for significantly intense reflections | 1.059 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKa |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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