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Information card for entry 4322592
Preview
| Coordinates | 4322592.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C22 H40 F6 N4 O6 S2 Zn |
|---|---|
| Calculated formula | C20 H40 N4 Zn |
| Title of publication | A Homologous Series of Homoleptic Zinc Bis(1,4-di-tert-butyl-1,4-diaza-1,3-butadiene) Complexes: Kx[Zn(t-BuNCHCHN-t-Bu)2], Zn(t-BuNCHCHN-t-Bu)2, and [Zn(t-BuNCHCHN-t-Bu)2](OTf)x (x = 1, 2) |
| Authors of publication | Evelien Rijnberg; Bodo Richter; Karl-H. Thiele; Jaap Boersma; Nora Veldman; Anthony L. Spek; Gerard van Koten |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1998 |
| Journal volume | 37 |
| Pages of publication | 56 - 63 |
| a | 18.015 ± 0.006 Å |
| b | 9.257 ± 0.006 Å |
| c | 20.012 ± 0.005 Å |
| α | 90° |
| β | 109.63 ± 0.03° |
| γ | 90° |
| Cell volume | 3143 ± 2 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.084 |
| Residual factor for significantly intense reflections | 0.068 |
| Weighted residual factors for all reflections | 0.1783 |
| Weighted residual factors for significantly intense reflections | 0.1688 |
| Goodness-of-fit parameter for all reflections | 1.013 |
| Goodness-of-fit parameter for significantly intense reflections | 1.094 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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