Information card for entry 4323018

Structure parameters

• Formula: H12 Mo6 O30 Rb4 Te2
• Calculated formula: Mo6 O30 Rb4 Te2
• SMILES: [O]12[Te]3[O]4[Mo]56([O]7[Te]8[O]9[Mo]1(O[Mo]12(=O)([O]8[Mo]4(O1)(O6)(=O)=O)=O)(O[Mo]19([O]3[Mo]7(O5)(O1)(=O)=O)(=O)=O)(=O)=O)(=O)=O.O.O.O.[Rb+].[Rb+].O.O.O.[Rb+].[Rb+]
• Title of publication: Low-Temperature Syntheses and Characterization of Novel Layered Tellurites, A2Mo3TeO12 (A = NH4, Cs), and "Zero-Dimensional" Tellurites, A4Mo6Te2O24.6H2O (A = Rb, K)
• Authors of publication: Vidyavathy; K. Vidyasagar
• Journal of publication: Inorganic Chemistry
• Year of publication: 1998
• Journal volume: 37
• Pages of publication: 4764 - 4774
• a: 10.0564 ± 0.0014 Å
• b: 9.877 ± 0.008 Å
• c: 15.724 ± 0.003 Å
• α: 90°
• β: 109.988 ± 0.011°
• γ: 90°
• Cell volume: 1467.7 ± 1.2 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0429
• Residual factor for significantly intense reflections: 0.0339
• Weighted residual factors for all reflections: 0.0782
• Weighted residual factors for significantly intense reflections: 0.0753
• Goodness-of-fit parameter for all reflections: 1.174
• Goodness-of-fit parameter for significantly intense reflections: 1.232
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No