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Information card for entry 4323149
Preview
| Coordinates | 4323149.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C13.5 H27 Cl6 O3.5 S3 W2 |
|---|---|
| Calculated formula | C13.5 H27 Cl6 O3.5 S3 W2 |
| Title of publication | Syntheses, Crystal Structures, Spectroscopic Characterization, and Electrochemical Studies of the Ditungsten(III) Complexes Cl~3~W(μ-L)~3~WCl~3~ and [Cl~3~W(μ-L)~2~(μ-Cl)WCl~3~]^-^ (L = 1,4-Dithiane, 1,4-Thioxane, pms = Pentamethylene Sulfide). C-S Bond Cleavage of the Bridging Thioether(s) in Cl~3~W(μ-L)~3~WCl~3~ |
| Authors of publication | P. Michael Boorman; Naomi L. Langdon; Vivian J. Mozol; Masood Parvez; Glenn P. A. Yap |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1998 |
| Journal volume | 37 |
| Pages of publication | 6023 - 6029 |
| a | 25.7603 ± 0.0003 Å |
| b | 25.7603 ± 0.0003 Å |
| c | 18.6771 ± 0.0002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 12394 ± 0.2 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 130 |
| Hermann-Mauguin space group symbol | P 4/n c c :2 |
| Hall space group symbol | -P 4a 2ac |
| Residual factor for all reflections | 0.0849 |
| Residual factor for significantly intense reflections | 0.0763 |
| Weighted residual factors for all reflections | 0.1348 |
| Weighted residual factors for significantly intense reflections | 0.1309 |
| Goodness-of-fit parameter for all reflections | 1.218 |
| Goodness-of-fit parameter for significantly intense reflections | 1.234 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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