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Information card for entry 4323446
Preview
| Coordinates | 4323446.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | [2(S),3(S)-Bis(diphenylphosphino)butane-(eta-5-cyclopentadienyl)-(methyl-ph= enyl-sulfoxide)-ruthenium]hexafluorophosphate |
|---|---|
| Formula | C40 H41 F6 O P3 Ru S |
| Calculated formula | C40 H41 F6 O P3 Ru S |
| Title of publication | Oxidation of Thioether Ligands in Pseudotetrahedral Cyclopentadienylruthenium Complexes: Toward a New Stereoselective Synthesis of Chiral Sulfoxides1 |
| Authors of publication | Wolfdieter A. Schenk; Jürgen Frisch; Michael Dürr; Nicolai Burzlaff; Dietmar Stalke; Roland Fleischer; Waldemar Adam; Frank Prechtl; Alexander K. Smerz |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 1997 |
| Journal volume | 36 |
| Pages of publication | 2372 - 2378 |
| a | 14.1664 ± 0.0013 Å |
| b | 15.792 ± 0.002 Å |
| c | 17.641 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3946.6 ± 0.8 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0792 |
| Residual factor for significantly intense reflections | 0.05 |
| Weighted residual factors for all reflections | 0.1449 |
| Weighted residual factors for significantly intense reflections | 0.1281 |
| Goodness-of-fit parameter for all reflections | 1.058 |
| Goodness-of-fit parameter for significantly intense reflections | 1.056 |
| Diffraction radiation wavelength | 0.7093 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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