Information card for entry 4323457

Structure parameters

• Formula: C84 H112 Au2 N6 P2 Si8 Sn2
• Calculated formula: C84 H112 Au2 N6 P2 Si8 Sn2
• SMILES: [Au]12([Au](C[P+](C2)(c2ccccc2)c2ccccc2)(C[P+](C1)(c1ccccc1)c1ccccc1)[Sn]12N(c3ccc(cc3)C)[Si](C)(C)[Si](C)([Si](C)(C)N1c1ccc(cc1)C)[Si](C)(C)N2c1ccc(cc1)C)[Sn]12N(c3ccc(cc3)C)[Si](C)(C)[Si](C)([Si](C)(C)N1c1ccc(cc1)C)[Si](C)(N2c1ccc(cc1)C)C
• Title of publication: Tris(amido)tingold Complexes in Different Oxidation States. First Structural Characterization of a Sn-Au-Au-Sn Linear Chain
• Authors of publication: Bernd Findeis; Maria Contel; Lutz H. Gade; Mariano Laguna; M. Concepción Gimeno; Ian J. Scowen; Mary McPartlin
• Journal of publication: Inorganic Chemistry
• Year of publication: 1997
• Journal volume: 36
• Pages of publication: 2386 - 2390
• a: 12.923 ± 0.004 Å
• b: 20.274 ± 0.007 Å
• c: 18.255 ± 0.006 Å
• α: 90°
• β: 104.7 ± 0.01°
• γ: 90°
• Cell volume: 4626 ± 3 ų
• Cell temperature: 173 ± 2 K
• Ambient diffraction temperature: 173 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0956
• Residual factor for significantly intense reflections: 0.0493
• Weighted residual factors for all reflections: 0.1204
• Weighted residual factors for significantly intense reflections: 0.1034
• Goodness-of-fit parameter for all reflections: 0.894
• Goodness-of-fit parameter for significantly intense reflections: 1.045
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No