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Information card for entry 4324766
Preview
| Coordinates | 4324766.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C23 H33 N3 O3 S |
|---|---|
| Calculated formula | C23 H33 N3 O3 S |
| SMILES | S(\C(=N/N=C/c1c(O)c(cc(c1)C(C)(C)C)C(C)(C)C)NC=C(C(=O)C)C(=O)C)C |
| Title of publication | Syntheses, Electronic Structures, and EPR/UV-Vis-NIR Spectroelectrochemistry of Nickel(II), Copper(II), and Zinc(II) Complexes with a Tetradentate Ligand Based on S-Methylisothiosemicarbazide |
| Authors of publication | Vladimir B. Arion; Peter Rapta; Joshua Telser; Sergiu S. Shova; Martin Breza; Karol Lušpai; Jozef Kožišek |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2011 |
| Journal volume | 50 |
| Pages of publication | 2918 - 2931 |
| a | 10.0352 ± 0.0013 Å |
| b | 14.3427 ± 0.0016 Å |
| c | 17.316 ± 0.002 Å |
| α | 78.711 ± 0.007° |
| β | 79.905 ± 0.007° |
| γ | 87.707 ± 0.008° |
| Cell volume | 2406.2 ± 0.5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.1967 |
| Residual factor for significantly intense reflections | 0.0673 |
| Weighted residual factors for significantly intense reflections | 0.1255 |
| Weighted residual factors for all reflections included in the refinement | 0.1672 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.928 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.