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Information card for entry 4326445
Preview
| Coordinates | 4326445.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | [(2-(diphenylphosphine)thiaphenolato)(m-methylphenylethane -1,2-diylbis(thio-2,1-phenylene)diphenylphosphine)ruthenium(II)] hexafluorophosphate |
|---|---|
| Formula | C64.5 H52 Cl3 F6 P4 Ru S3 |
| Calculated formula | C64.5 H52 Cl3 F6 P4 Ru S3 |
| Title of publication | Metal-Stabilized Thiyl Radicals as Scaffolds for Reversible Alkene Addition via C-S Bond Formation/Cleavage |
| Authors of publication | Kagna Ouch; Mark S. Mashuta; Craig A. Grapperhaus |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2011 |
| Journal volume | 50 |
| Pages of publication | 9904 - 9914 |
| a | 10.5855 ± 0.0004 Å |
| b | 16.8551 ± 0.0005 Å |
| c | 17.7704 ± 0.0004 Å |
| α | 90° |
| β | 104.576 ± 0.003° |
| γ | 90° |
| Cell volume | 3068.54 ± 0.17 Å3 |
| Cell temperature | 100.1 K |
| Ambient diffraction temperature | 100.1 K |
| Number of distinct elements | 7 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0563 |
| Residual factor for significantly intense reflections | 0.0438 |
| Weighted residual factors for significantly intense reflections | 0.1042 |
| Weighted residual factors for all reflections included in the refinement | 0.1136 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.014 |
| Diffraction radiation wavelength | 0.7107 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4326445.html
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