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Information card for entry 4327620
Preview
| Coordinates | 4327620.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H60 Li2 N8 O2 P2 Si2 |
|---|---|
| Calculated formula | C28 H60 Li2 N8 O2 P2 Si2 |
| SMILES | [Li]1([N]2([Si](C)(C)C)c3cccc4c3c([N]1([Li]2[O]=P(N(C)C)(N(C)C)N(C)C)[Si](C)(C)C)ccc4)[O]=P(N(C)C)(N(C)C)N(C)C |
| Title of publication | Synthesis and Structural Characterization of Metalated 1,8-Bis(silylamino)naphthalene Derivatives |
| Authors of publication | Christian H. Galka; Dominique J. M. Trösch; Ina Rüdenauer; Lutz H. Gade; Ian Scowen; Mary McPartlin |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2000 |
| Journal volume | 39 |
| Pages of publication | 4615 - 4620 |
| a | 18.983 ± 0.002 Å |
| b | 11.1727 ± 0.0013 Å |
| c | 19.768 ± 0.002 Å |
| α | 90° |
| β | 110.603 ± 0.005° |
| γ | 90° |
| Cell volume | 3924.5 ± 0.7 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0579 |
| Residual factor for significantly intense reflections | 0.0429 |
| Weighted residual factors for significantly intense reflections | 0.1054 |
| Weighted residual factors for all reflections included in the refinement | 0.1169 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.035 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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