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Information card for entry 4331803
Preview
| Coordinates | 4331803.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H36 Cl10 Ga2 N4 O4 |
|---|---|
| Calculated formula | C24 H36 Cl10 Ga2 N4 O4 |
| SMILES | C1(N2C(COC2=C2N1C(CO2)(C)C)(C)C)=[Ga](=C1N2C(COC2=C2N1C(CO2)(C)C)(C)C)(Cl)Cl.C(Cl)Cl.C(Cl)Cl.Cl[Ga](Cl)(Cl)[Cl-] |
| Title of publication | Molecular versus Ionic Structures in Adducts of GaX3 with Monodentate Carbon-Based Ligands |
| Authors of publication | Ahmad El-Hellani; Julien Monot; Régis Guillot; Christophe Bour; Vincent Gandon |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2013 |
| Journal volume | 52 |
| Pages of publication | 506 - 514 |
| a | 22.605 ± 0.005 Å |
| b | 13.272 ± 0.005 Å |
| c | 12.436 ± 0.005 Å |
| α | 90° |
| β | 91.346 ± 0.005° |
| γ | 90° |
| Cell volume | 3730 ± 2 Å3 |
| Cell temperature | 100 ± 1 K |
| Ambient diffraction temperature | 100 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 9 |
| Hermann-Mauguin space group symbol | C 1 c 1 |
| Hall space group symbol | C -2yc |
| Residual factor for all reflections | 0.0411 |
| Residual factor for significantly intense reflections | 0.0287 |
| Weighted residual factors for significantly intense reflections | 0.0514 |
| Weighted residual factors for all reflections included in the refinement | 0.0551 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.995 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4331803.html
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