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Information card for entry 4332253
Preview
| Coordinates | 4332253.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H15 Cu3 I N3 O Se3 W |
|---|---|
| Calculated formula | C15 H15 Cu3 I N3 O Se3 W |
| Title of publication | Construction of New Heteroselenometallic Clusters: Formation of Crownlike [Et4N]4[(μ5-WSe4)(CuI)5(μ-I)2] and Octahedral Polymeric [(μ6-WSe4)Cu6I4(py)4]nfrom Planar [Et4N]4[(μ4-WSe4)Cu4I6] with Additional Faces |
| Authors of publication | Zhang, Qian-Feng; Yu, Zhan; Ding, Jihai; Song, Yinglin; Rothenberger, Alexander; Fenske, Dieter; Leung, Wa-Hung |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 13 |
| Pages of publication | 5187 - 5195 |
| a | 8.2156 ± 0.0016 Å |
| b | 8.8229 ± 0.0018 Å |
| c | 15.84 ± 0.003 Å |
| α | 102.88 ± 0.03° |
| β | 97.93 ± 0.03° |
| γ | 94.94 ± 0.03° |
| Cell volume | 1100.4 ± 0.4 Å3 |
| Cell temperature | 120 ± 2 K |
| Ambient diffraction temperature | 120 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0626 |
| Residual factor for significantly intense reflections | 0.0581 |
| Weighted residual factors for significantly intense reflections | 0.1178 |
| Weighted residual factors for all reflections included in the refinement | 0.1258 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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