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Information card for entry 4332406
Preview
| Coordinates | 4332406.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H36 Ge4 N4 O2 Sn4 |
|---|---|
| Calculated formula | C12 H36 Ge4 N4 O2 Sn4 |
| SMILES | C[Ge](C)(C)[N]12[Sn]3[N]4([Sn]5[N]([Ge](C)(C)C)([Sn]1[N]35[Ge](C)(C)C)[Sn]24)[Ge](C)(C)C.O.O |
| Title of publication | Synthesis and Characterization of Imidocubanes with Exocube GeIVand SnIVSubstituents: [M(μ3-NGeMe3)]4(M = Sn, Ge, Pb); [Sn(μ3-NSnMe3)]4 |
| Authors of publication | Eichler, Jack F.; Just, Oliver; Rees, William S. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 17 |
| Pages of publication | 6706 - 6712 |
| a | 12.52 ± 0.004 Å |
| b | 17.891 ± 0.005 Å |
| c | 15.642 ± 0.005 Å |
| α | 90° |
| β | 107.536 ± 0.005° |
| γ | 90° |
| Cell volume | 3340.9 ± 1.8 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1583 |
| Residual factor for significantly intense reflections | 0.0865 |
| Weighted residual factors for significantly intense reflections | 0.2208 |
| Weighted residual factors for all reflections included in the refinement | 0.2579 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.975 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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