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Information card for entry 4332436
Preview
| Coordinates | 4332436.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H47 N3 O6 V |
|---|---|
| Calculated formula | C32 H47 N3 O6 V |
| SMILES | [V]123(Oc4c(O1)cccc4)(Oc1c(O2)cccc1)Oc1c(O3)cccc1.[NH+](CC)(CC)CC.[NH+](CC)(CC)CC.N#CC |
| Title of publication | Charge Distribution in Chromium and Vanadium Catecholato Complexes: X-ray Absorption Spectroscopic and Computational Studies |
| Authors of publication | Milsmann, Carsten; Levina, Aviva; Harris, Hugh H.; Foran, Garry J.; Turner, Peter; Lay, Peter A. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 12 |
| Pages of publication | 4743 - 4754 |
| a | 10.244 ± 0.002 Å |
| b | 10.743 ± 0.002 Å |
| c | 29.639 ± 0.007 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 3261.8 ± 1.2 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 19 |
| Hermann-Mauguin space group symbol | P 21 21 21 |
| Hall space group symbol | P 2ac 2ab |
| Residual factor for all reflections | 0.0611 |
| Residual factor for significantly intense reflections | 0.0521 |
| Weighted residual factors for significantly intense reflections | 0.1355 |
| Weighted residual factors for all reflections included in the refinement | 0.1395 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.295 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Duplicate of | 4332434 |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4332436.html
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Users of the data should acknowledge the original authors of the
structural data.