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Information card for entry 4332929
Preview
| Coordinates | 4332929.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C28 H50 Cu2 Fe P2 Se2 |
|---|---|
| Calculated formula | C28 H50 Cu2 Fe P2 Se2 |
| SMILES | [Se]12[Cu]3([Se]([Cu]13[P](C(C)C)(C(C)C)C(C)C)[c]13[cH]4[Fe]56789%101([c]12[cH]5[cH]6[cH]7[cH]81)[cH]3[cH]9[cH]4%10)[P](C(C)C)(C(C)C)C(C)C |
| Title of publication | Ferrocenyldiselenolate-Stabilized Copper−Selenium Clusters |
| Authors of publication | Nitschke, Christian; Fenske, Dieter; Corrigan, John F. |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2006 |
| Journal volume | 45 |
| Journal issue | 23 |
| Pages of publication | 9394 - 9401 |
| a | 10.5499 ± 0.0007 Å |
| b | 12.4427 ± 0.001 Å |
| c | 25.042 ± 0.002 Å |
| α | 90° |
| β | 99.12 ± 0.02° |
| γ | 90° |
| Cell volume | 3245.7 ± 0.5 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0701 |
| Residual factor for significantly intense reflections | 0.0555 |
| Weighted residual factors for significantly intense reflections | 0.1461 |
| Weighted residual factors for all reflections included in the refinement | 0.1792 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.103 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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