Information card for entry 4337408

Structure parameters

• Formula: C34 H59 N3 O2 Si2 Yb
• Calculated formula: C34 H59 N3 O2 Si2 Yb
• SMILES: [Yb]1234567(N([Si](C)(C)C)[Si](C)(C)C)([O](c8c(N1C(=N[c]14[c]5([cH]6[cH]7[cH]2[c]31C(C)C)C(C)C)C(C)(C)C)cccc8)C)[O]1CCCC1
• Title of publication: Divalent heteroleptic ytterbium complexes - effective catalysts for intermolecular styrene hydrophosphination and hydroamination.
• Authors of publication: Basalov, Ivan V.; Roşca, Sorin Claudiu; Lyubov, Dmitry M.; Selikhov, Alexander N.; Fukin, Georgy K.; Sarazin, Yann; Carpentier, Jean-François; Trifonov, Alexander A.
• Journal of publication: Inorganic chemistry
• Year of publication: 2014
• Journal volume: 53
• Journal issue: 3
• Pages of publication: 1654 - 1661
• a: 10.3636 ± 0.0006 Å
• b: 17.943 ± 0.001 Å
• c: 20.4406 ± 0.0011 Å
• α: 79.836 ± 0.002°
• β: 88.185 ± 0.002°
• γ: 87.923 ± 0.002°
• Cell volume: 3737.7 ± 0.4 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 6
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.041
• Residual factor for significantly intense reflections: 0.0298
• Weighted residual factors for significantly intense reflections: 0.0652
• Weighted residual factors for all reflections included in the refinement: 0.0674
• Goodness-of-fit parameter for all reflections included in the refinement: 1.01
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No