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Information card for entry 4337900
Preview
| Coordinates | 4337900.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C26 H40 Al Bi Cl4 N2 Si |
|---|---|
| Calculated formula | C26 H40 Al Bi Cl4 N2 Si |
| SMILES | [Bi]1([Cl][Al](Cl)(Cl)Cl)N(c2c(cccc2C(C)C)C(C)C)[Si](N1c1c(cccc1C(C)C)C(C)C)(C)C |
| Title of publication | Low-Coordinate Bismuth Cations. |
| Authors of publication | Schwamm, Ryan J.; Day, Benjamin M.; Coles, Martyn P.; Fitchett, Christopher M. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 7 |
| Pages of publication | 3778 |
| a | 24.9726 ± 0.001 Å |
| b | 16.6486 ± 0.0004 Å |
| c | 16.1717 ± 0.0006 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 6723.5 ± 0.4 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 60 |
| Hermann-Mauguin space group symbol | P b c n |
| Hall space group symbol | -P 2n 2ab |
| Residual factor for all reflections | 0.1307 |
| Residual factor for significantly intense reflections | 0.0767 |
| Weighted residual factors for significantly intense reflections | 0.1631 |
| Weighted residual factors for all reflections included in the refinement | 0.1886 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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