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Information card for entry 4338784
Preview
| Coordinates | 4338784.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H45 Cl Ir N Si Zr |
|---|---|
| Calculated formula | C25 H45 Cl Ir N Si Zr |
| SMILES | [Zr]12345678([Ir]9%10%11%12([H]1)([H]7)([H]8)[c]1([c]%11([c]%12([c]9([c]%101C)C)C)C)C)(Cl)N(C(C)(C)C)[Si]([c]12[c]3([c]4([c]5([c]61C)C)C)C)(C)C |
| Title of publication | A study on zr-ir multiple bonding active for C-h bond cleavage. |
| Authors of publication | Oishi, Masataka; Oshima, Masato; Suzuki, Hiroharu |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 13 |
| Pages of publication | 6634 - 6654 |
| a | 31.6204 ± 0.0009 Å |
| b | 11.1129 ± 0.0003 Å |
| c | 18.5103 ± 0.0005 Å |
| α | 90° |
| β | 119.454 ± 0.0008° |
| γ | 90° |
| Cell volume | 5663.7 ± 0.3 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 173 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0228 |
| Residual factor for significantly intense reflections | 0.0202 |
| Weighted residual factors for significantly intense reflections | 0.0442 |
| Weighted residual factors for all reflections included in the refinement | 0.045 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.063 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4338784.html
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