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Information card for entry 4338825
Preview
| Coordinates | 4338825.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | Ir6 Sn16 Yb6.572 |
|---|---|
| Calculated formula | Ir6 Sn16 Yb6.572 |
| Title of publication | Flux Growth of Yb6.6Ir6Sn16 Having Mixed-Valent Ytterbium. |
| Authors of publication | Peter, Sebastian C.; Subbarao, Udumula; Rayaprol, Sudhindra; Martin, Joshua B.; Balasubramanian, Mahalingam; Malliakas, Christos D.; Kanatzidis, Mercouri G. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 13 |
| Pages of publication | 6615 - 6623 |
| a | 9.7105 ± 0.0007 Å |
| b | 9.7105 ± 0.0007 Å |
| c | 13.7183 ± 0.0011 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 1293.55 ± 0.17 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 K |
| Number of distinct elements | 3 |
| Space group number | 137 |
| Hermann-Mauguin space group symbol | P 42/n m c :2 |
| Hall space group symbol | -P 4ac 2a |
| Residual factor for all reflections | 0.0699 |
| Residual factor for significantly intense reflections | 0.0636 |
| Weighted residual factors for significantly intense reflections | 0.1499 |
| Weighted residual factors for all reflections included in the refinement | 0.1568 |
| Goodness-of-fit parameter for significantly intense reflections | 3.11 |
| Goodness-of-fit parameter for all reflections included in the refinement | 3.11 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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structural data.