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Information card for entry 4339830
Preview
| Coordinates | 4339830.cif |
|---|---|
| Original paper (by DOI) | HTML |
| External links | PubChem |
| Formula | C44 H47 Ni O0.5 P4 |
|---|---|
| Calculated formula | C44 H47 Ni O0.5 P4 |
| SMILES | [Ni]123[P](CC[P@]1(CC[P@@]2(CC[P]3(c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1.O(CC)CC |
| Title of publication | Synthesis, structure, and electrochemistry of di- and zerovalent nickel, palladium, and platinum monomers and dimers derived from an enantiopure (S,S)-tetra(tertiary phosphine). |
| Authors of publication | Kitto, Heather J.; Rae, A. David; Webster, Richard D.; Willis, Anthony C.; Wild, S. Bruce |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2007 |
| Journal volume | 46 |
| Journal issue | 19 |
| Pages of publication | 8059 - 8070 |
| a | 14.6487 ± 0.0002 Å |
| b | 14.4641 ± 0.0002 Å |
| c | 19.0842 ± 0.0002 Å |
| α | 90° |
| β | 90.1252 ± 0.0009° |
| γ | 90° |
| Cell volume | 4043.56 ± 0.09 Å3 |
| Cell temperature | 200 K |
| Ambient diffraction temperature | 200 K |
| Number of distinct elements | 5 |
| Space group number | 4 |
| Hermann-Mauguin space group symbol | P 1 21 1 |
| Hall space group symbol | P 2yb |
| Residual factor for all reflections | 0.0336 |
| Residual factor for significantly intense reflections | 0.0261 |
| Weighted residual factors for all reflections | 0.0283 |
| Weighted residual factors for significantly intense reflections | 0.025 |
| Weighted residual factors for all reflections included in the refinement | 0.025 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.1054 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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