Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4340099
Preview
| Coordinates | 4340099.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C15 H15 N Na2 O9 |
|---|---|
| Calculated formula | C15 H15 N Na2 O9 |
| SMILES | C(=O)(c1c[n+](cc(c1)C(=O)[O-])Cc1ccc(cc1)C(=O)[O-])[O-].O.[Na+].[Na+].O.O |
| Title of publication | Transmetalation of a Dodecahedral Na9 Aggregate-Based Polymer: A Facile Route to Water Stable Cu(II) Coordination Networks. |
| Authors of publication | Chen, Jin-Xiang; Chen, Ming; Ding, Ni-Ni; Chen, Wen-Hua; Zhang, Wen-Hua; Hor, T. S. Andy; Young, David J. |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 14 |
| Pages of publication | 7446 - 7454 |
| a | 20.552 ± 0.0012 Å |
| b | 20.552 ± 0.0012 Å |
| c | 23.4904 ± 0.0013 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 8592.7 ± 0.9 Å3 |
| Cell temperature | 153 ± 2 K |
| Ambient diffraction temperature | 153 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.0964 |
| Residual factor for significantly intense reflections | 0.0909 |
| Weighted residual factors for significantly intense reflections | 0.2567 |
| Weighted residual factors for all reflections included in the refinement | 0.2621 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.068 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4340099.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.