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Information card for entry 4340895
Preview
| Coordinates | 4340895.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | cerium tellurium vanadate |
|---|---|
| Formula | Ce O20 Te3 V3 |
| Calculated formula | Ce O20 Te3 V3 |
| Title of publication | LnV3Te3O15(OH)3·nH2O (Ln = Ce, Pr, Nd, Sm, Eu, Gd; n = 1-2): A New Series of Semiconductors with Mixed-Valent Tellurium (IV,VI) Oxoanions. |
| Authors of publication | Lin, Jian; Diefenbach, Kariem; Fu, Jingcheng; Cross, Justin N.; Clark, Ronald J.; Albrecht-Schmitt, Thomas E |
| Journal of publication | Inorganic chemistry |
| Year of publication | 2014 |
| Journal volume | 53 |
| Journal issue | 17 |
| Pages of publication | 9058 - 9064 |
| a | 12.166 ± 0.005 Å |
| b | 12.166 ± 0.005 Å |
| c | 12.537 ± 0.005 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 1607 ± 1.1 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 194 |
| Hermann-Mauguin space group symbol | P 63/m m c |
| Hall space group symbol | -P 6c 2c |
| Residual factor for all reflections | 0.0427 |
| Residual factor for significantly intense reflections | 0.0389 |
| Weighted residual factors for significantly intense reflections | 0.0992 |
| Weighted residual factors for all reflections included in the refinement | 0.1017 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.149 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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